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"NVHeaps: Making Persistent Objects Fast and Safe with Next-Generation, Non-Volatile Memories," Joel Coburn, Adrian M. Caulfield, Ameen Akel, Laura M. Grupp, Rajesh K. Gupta, Ranjit Jhala and Steven Swanson. 16th Int'l Conference on Architectural Support for Programming Languages and Operating Systems (ASPLOS 2011), Mar 7, 2011 "Physically Justifiable Die-Level Modeling of Spatial Variation in View of Systematic Across Wafer Variability," Lerong Cheng, Puneet Gupta, Costas J. Spanos, Kun Qian, Lei He: . IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, pp. 388-401, Feb 17, 2011 "Reliably Erasing Data from Flash-Based Solid State Drives," Michael Wei, Laura M. Grupp, Fredrick E. Spada and Steven Swanson. Proc., 9th USENIX Conference on File and Storage Technologies (FAST 2011), Feb 16, 2011 "Robust System Design," S. Mitra, H. Cho, T. Hong, Y. Kim, H. Lee, L. Leem, Y. Li, D. Lin, E. Mintarno, S. Park, N. Patil, H. Wei and J. Zhang. IPSJ Trans. System LSI Design Methodology 2011, Feb 11, 2011 "Coding Methods for Emerging Non-Volatile Memories," Lara Dolecek, UCLA. Information Theory and Applications Workshop 2011, Feb 11, 2011 "LDPC Absorbing Sets, the Null Space of the Cycle Consistency Matrix, and Tanner's Constructions," Jiadong Wang, Lara Dolecek and Richard Wesel (all UCLA). Information Theory and Applications Workshop 2011, Feb 7, 2011 "Trading Accuracy for Power with an Underdesigned Multiplier Architecture," Parag Kulkarni, Puneet Gupta and Milos Ercegovac (UCLA). Proc. IEEE/ACM 24th International Conference on VLSI Design, Jan 5, 2011 "Robust System Design to Overcome CMOS Reliability Challenges," S. Mitra, K. Brelsford, Y. Kim, K. Lee and Y. Li. IEEE Journal on Emerging and Selected Topics in Circuits and Systems: Special Issue on the IEEE CAS Forum, Dec 15, 2010 "Beyond the Datasheet: Using Test Beds to Probe Non-Volatile Memories Dark Secrets," Laura M. Grupp, Adrian M. Caulfield, Joel Coburn, John D. Davis, and Steven Swanson. IEEE Global Communications Workshop on application of Communication Theory to Emerging Memory Technologies (ACTEMT 2010), Dec 10, 2010 "Error Characterization and Coding Schemes for Flash Memories," Eitan Yaakobi, Jing Ma, Laura M. Grupp, Paul H. Siegel, Steven Swanson and Jack K. Wolf. IEEE Global Communications Workshop on application of Communication Theory to Emerging Memory Technologies (ACTEMT 2010), Dec 10, 2010 "Towards Longer Lifetime of Emerging Memory Technologies Using Number Theory," Lara Dolecek, UCLA. Proc. IEEE Global Communications 2010, Dec 9, 2010 "Active learning framework for post-silicon variation extraction and test cost reduction," C. Zhuo, K. Agarwal, D. Sylvester, and D. Blaauw. Proc. IEEE/ACM International Conference on Computer-Aided Design 2010, pp. 508-515, Nov 11, 2010 "A Case for Opportunistic Embedded Sensing in Presence of Hardware Power Variability," Lucas Wanner, Charwak Apte, Rahul Balani, Puneet Gupta, and Mani Srivastava. USENIX HotPower 2010, Oct 1, 2010 "Dynamic NBTI management using a 45nm multi-degradation sensor," P. Singh, E. Karl, D. Sylvester, and D. Blaauw. Proc. IEEE Custom Integrated Circuits Conference 2010, Sep 21, 2010 "Finding Flash Features: Bigger, Better, Faster... Stronger ECC," Laura M. Grupp, Hung-Wei Tseng, Adrian M. Caulfield, Joel Coburn, Eitan Yaakobi, Paul H. Siegel, Jack K. Wolf and Steven Swanson. Flash Memory Summit, Aug 18, 2010 |
